Din, G. 2004, May 3–5, The XML to TTCN-3 Mapping. Unpublished paper presented at ETSI TTCN-3 User Conference 2004, Sophia Antipolis (France). |
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Last edited by: Deleted user 13/08/2008, 12:28 |
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Din, G. 2008, June 3–6, A TTCN3 based Benchmark for BPEL Engines. Unpublished paper presented at ETSI TTCN-3 User Conference 2008, Madrid (Spain). |
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Last edited by: Deleted user 17/09/2008, 15:50 |
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Din, G. (2008). An IMS Performance Benchmark Implementation based on the TTCN-3 Language. Software Tools for Technology Transfer (STTT) 2008, 10(4), 359–370. |
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Last edited by: Deleted user 13/08/2008, 15:06 |
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Din, G. 2008, June 3–July 6, Performance testing/benchmarking with ttcn-3. Unpublished paper presented at ETSI TTCN-3 User Conference 2008, Madrid (Spain). |
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Last edited by: Deleted user 09/01/2013, 16:56 |
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Din, G., & Rentea, C. 2006, May 31–June 2, Using TTCN-3 to Design Performance Tests. Unpublished paper presented at ETSI TTCN-3 User Conference 2006, Berlin (Germany). |
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Last edited by: Deleted user 13/08/2008, 14:26 |
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Din, G., Vega, D., Petre, R., & Hoffmann, A. 2007, May 31–June 1, TTCN-3 based Implementation of ETSI TISPAN IMS Benchmark. Unpublished paper presented at ETSI TTCN-3 User Conference 2007, Stockholm (Sweden). |
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Last edited by: Deleted user 20/08/2008, 11:34 |
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Schieferdecker, I., Grabowski, J., Vassiliou-Gioles, T., & Din, G. (2008). The Test Technology TTCN-3. In Formal Methods and Testing, LNCS 2008 1st ed. (pp. 292–319). Berlin Heidelberg: Springer-Verlag. |
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Last edited by: Deleted user 13/08/2008, 15:05 |
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Schieferdecker, I., Vega, D., & Din, G. 2009, June 3–5, A ttcn-3 test automation framework for hl7/ihe based applications. Unpublished paper presented at ETSI TTCN-3 User Conference 2009, Sophia Antipolis (France). |
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Added by: Axel Rennoch 05/04/2013, 23:19 |
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Vega, D., Din, G., & Rentea, C. 2006, May 31–June 2, Towards Quality Evaluation of TTCN-3 Tests. Unpublished paper presented at ETSI TTCN-3 User Conference 2006, Berlin (Germany). |
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Last edited by: Deleted user 13/08/2008, 14:20 |
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Vega, D., Schieferdecker, I., & Din, G. 2007, June 26–29, Test Data Variance as a Test Quality Measure: Exemplified for TTCN-3. Paper presented at Testing of Communication Systems (Testcom/Fates/Forte) 2007, Berlin Heidelberg. |
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Added by: Deleted user 02/04/2009, 13:48 |
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